MDO4000B

Cursors Waveform and Screen. Automatic measurements (time domain) 30, of which up to eight can be displayed on-screen at any one time. Measurements include: Period, Frequency, Delay, Rise Time, Fall Time, Positive Duty Cycle, Negative Duty Cycle, Positive Pulse Width, Negative Pulse Width, Burst Width, Phase, Positive Overshoot, Negative Overshoot, Total Overshoot, Peak to Peak, Amplitude, High, Low, Max, Min, Mean, Cycle Mean, RMS, Cycle RMS, Positive Pulse Count, Negative Pulse Count, Rising Edge Count, Falling Edge Count, Area and Cycle Area. Automatic measurements (frequency domain) 3, of which one can be displayed on-screen at any one time. Measurements include Channel Power, Adjacent Channel Power Ratio (ACPR), and Occupied Bandwidth (OBW) Measurement statistics Mean, Min, Max, Standard Deviation. Reference levels User-definable reference levels for automatic measurements can be specified in either percent or units. Gating Isolate the specific occurrence within an acquisition to take measurements on, using either the screen, or waveform cursors. Waveform histogram A waveform histogram provides an array of data values representing the total number of hits inside of a user-defined region of the display. A waveform histogram is both a visual graph of the hit distribution as well as a numeric array of values that can be measured. Sources - Channel 1, Channel 2, Channel 3, Channel 4, Ref 1, Ref 2, Ref 3, Ref 4, Math Types - Vertical, Horizontal Waveform histogram measurements Waveform Count, Hits in Box, Peak Hits, Median, Max, Min, Peak-to-Peak, Mean, Standard Deviation, Sigma 1, Sigma 2, Sigma 3 Waveform math Arithmetic Add, subtract, multiply, and divide waveforms. Math functions Integrate, Differentiate, FFT. FFT Spectral magnitude. Set FFT Vertical Scale to Linear RMS or dBV RMS, and FFT Window to Rectangular, Hamming, Hanning, or Blackman-Harris. Spectrum math Add or subtract frequency-domain traces. Advanced math Define extensive algebraic expressions including waveforms, reference waveforms, math functions (FFT, Intg, Diff, Log, Exp, Sqrt, Abs, Sine, Cosine, Tangent, Rad, Deg), scalars, up to two user-adjustable variables and results of parametric measurements (Period, Freq, Delay, Rise, Fall, PosWidth, NegWidth, BurstWidth, Phase, PosDutyCycle, NegDutyCycle, PosOverShoot, NegOverShoot, PeakPeak, Amplitude, RMS, CycleRMS, High, Low, Max, Min, Mean, CycleMean, Area, CycleArea, and trend plots), e.g.,(Intg(Ch1 - Mean(Ch1)) × 1.414 × VAR1). Act on Event Events None, when a trigger occurs, or when a defined number of acquisitions complete (1 to 1,000,000) Actions Stop acquisition, save waveform to file, save screen image, print, AUX OUT Pulse, remote interface SRQ, e-mail notification, and visual notification. Repeat Repeat the act on event process (1 to 1,000,000 and infinity) Video Picture Mode (optional) Sources Channel 1, Channel 2, Channel 3, Channel 4 Video standards NTSC, PAL Contrast and brightness Manual and automatic Field selection Odd, Even, Interlaced Picture location on screen Selectable X and Y location, width and height adjustment, start line and pixel and line-to-line offset control. Power measurements (optional) Power Quality Measurements VRMS, VCrest Factor, Frequency, IRMS, ICrest Factor, True Power, Apparent Power, Reactive Power, Power Factor, Phase Angle. Switching loss measurements Power loss Ton, Toff, Conduction, Total. Energy loss Ton, Toff, Conduction, Total. Harmonics THD-F, THD-R, RMS measurements. Graphical and table displays of harmonics. Test to IEC61000-3-2 Class A and MILSTD-1399, Section 300A. Ripple measurements VRipple and IRipple. Modulation Analysis Graphical display of +Pulse Width, –Pulse Width, Period, Frequency, +Duty Cycle, and –Duty Cycle modulation types. Safe operating area Graphical display and mask testing of switching device safe operating area measurements. dV/dt and dI/dt measurements Cursor measurements of slew rate.Limit/Mask testing (optional) Included standard masks 4 ITU-T, ANSI T1.102, USB Test source Limit test: Any Ch1 - Ch4 or any R1 - R4 Mask test: Any Ch1 - Ch4 Mask creation Limit test vertical tolerance from 0 to 1 division in 1 m division increments; Limit test horizontal tolerance from 0 to 500 m division in 1 m division increments Load standard mask from internal memory Load custom mask from text file with up to 8 segments Mask scaling Lock to Source ON (mask automatically re-scales with source-channel settings changes) Lock to Source OFF (mask does not re-scale with source-channel settings changes) Test criteria run until Minimum number of waveforms (from 1 to 1,000,000; Infinity) Minimum elapsed time (from 1 second to 48 hours; Infinity) Violation threshold From 1 to 1,000,000 Actions on test failure Stop acquisition, save screen image to file, save waveform to file, print screen image, trigger out pulse, set remote interface SRQ Actions on test complete Trigger out pulse, set remote interface SRQ Results display Test status, total waveforms, number of violations, violation rate, total tests, failed tests, test failure rate, elapsed time, total hits for each mask segment