MSO/DPO70000 Series

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MSO/DPO70000 Series


54 automatic neasurements; Amplitude, High, Low, Maximum, Minimum, Peak-to-Peak, Mean, Cycle Mean, RMS, Cycle RMS, Positive Overshoot, Negative Overshoot, Rise Time, Fall Time, Positive Width, Negative Width, Positive Duty Cycle, Negative Duty Cycle, Period, Frequency, Delay, Area, Cycle Area, Phase, Burst Width, Waveform Count, Hits in Box, Peak Hits, Median, Maximum, Minimum, Peak-to-Peak, Mean (μ), Standard Deviation (sigma), μ +1sigma, μ +2sigma, μ +3sigma, Define extensive algebraic expressions including Waveforms, Scalars, User-adjustable Variables, and Results of Parametric Measurements e.g. (Integral (CH1 ‒ Mean(CH1)) × 1.414 × VAR1), Add, Subtract, Multiply, Divide Waveforms and Scalar, User-definable filters. Users specify a file containing the coefficients of the filter. Several example filter files are provided, Spectral Magnitude and Phase, Real and Imaginary Spectra, Generates a Waveform Database pixel map from a sample waveform. Sample count can be defined, Average, Invert, Integrate, Differentiate, Square Root, Exponential, Log 10, Log e, Abs, Ceiling, Floor, Min, Max, Sin, Cos, Tan, ASin, ACos, ATan, Sinh, Cosh, Tanh, Boolean result of comparison >, <, ≥, ≤, ==, !=,Magnitude: Linear, dB, dBm Phase: Degrees, radians, group delay IRE and mV unit, Rectangular, Hamming, Hanning, Kaiser-Bessel, Blackman-Harris, Gaussian, Flattop2, Tek Exponential, An interface is provided to allow users to create their own custom math functions in MATLAB or Visual Studio

Company Tektronix
Part Number mso_dpo_70000
Bandwidth 4-33 GHz
Max Sample Rate 100 GS/sec
Channels 4 analog; 16 digital
Max Memory Depth 1 Gpts
Waveform Update Rate/Max Trigger Rate 300,000 wfms/sec
Display size/Touch or non-touch screen 12.1 in. LCD 1024x768; Display Port, VGA, DVI-D
Vertical Resolution 8 bit (11 bit with averaging)
Instrument Integrations 16-channel logic analyzer
Trigger Modes Edge Positive or negative slope on any channel or front-panel auxiliary input. Coupling includes DC, AC, noise reject, HF reject, and LF reject. Frequency/Period Trigger on event that crosses threshold twice with same slope within or outside of selectable time limits. Slope may be positive, negative or either. Glitch Trigger on or reject glitches of positive, negative, or either polarity. Minimum glitch width is 40 ps (typical) with rearm time of 50 ps (<5 ns interval), 75 ps above 5 ns. Pattern Trigger when pattern goes false or stays true for specified period of time. Pattern (AND, OR, NAND, NOR) specified for four input channels. Runt Trigger on a pulse that crosses one threshold but fails to cross a second threshold before crossing the first again. Event can be time- or logic-qualified. Minimum runt width is 40 ps (typical) with rearm time of 50 ps Setup/Hold Trigger on violations of both setup time and hold time between clock and data present on any two input channels. State Any logical pattern of channels (1, 2, 3) clocked by edge on channel 4. Trigger on rising or falling clock edge. Timeout Trigger on an event which remains high, low, or either, for a specified time period. Selectable from 300 ps. Transition Trigger on pulse edge rates that are faster or slower than specified. Slope may be positive, negative, or either. Width Trigger on width of positive or negative pulse either within or out of selectable time limits (down to 40 ps). Window Trigger on an event that enters or exits a window defined by two user-adjustable thresholds. Event can be time or logic qualified. Visual Trigger Trigger when the Visual Trigger expression is satisfied. Envelope Qualification applied to Edge, Glitch, Width or Runt trigger such that trigger type is performed on the detected envelope of a modulated carrier. Carrier frequency 250 MHz to 15 GHz. Minimum burst width <20 ns, maximum gap between bursts <20 ns. Trigger Delay by Events 1 to 2 billion events. Trigger Delay by Time 3.2 ns to 3 million seconds. B-Event Scan B-Event Scan is an A to B trigger sequence that will trigger and capture burst event data of interest as defined in the B-Event Scan setup menu. Captured bits can be scanned in a sequential or randomized fashion, and alternatively the trigger can toggle between two successive B trigger events. Eye diagrams can be constructed with burst data acquired as a result of scanning B-Event.
Vertical Sensitivity 6.25 mV/div to 600 mV/div
Time Base Range –5.0 ks to 1.0 ks (Time base delay time range)
Time Scale Accuracy ± 1.5 ppm initial accuracy. Aging < 1 ppm per year
Footprint 18.9 (W) × 12.25 (H) × 21.5 (D) in.
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